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Test equipment

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Test equipment

Serial vector format (SVF)

Semiconductors; Test equipment

SVF is the media for exchanging descriptions of high-level IEEE 1149.1 bus operations. In general, IEEE 1149.1 bus operations consist of scan operations and movements between different stable states ...

Standing wave ratio (SWR)

Semiconductors; Test equipment

Sometimes called voltage standing wave ratio. Describes the deviation of an impedance from the characteristic impedance Z. The SWR is calculated from the reflection coefficient r. SWR = (1 +

Solid state relay (SSR)

Semiconductors; Test equipment

An electrical switching device, which uses a semiconductor to block or conduct current flow in a circuit with respect to the status of a control signal.

Standard test and programming language (STAPL)

Semiconductors; Test equipment

Pioneered by Xilinx and adapted by other device vendors as a device programming language

Test access mechanism (TAM)

Semiconductors; Test equipment

The connectivity and protocol structure used to access an instrument. For IEEE Std 1500, a defined TAM exists.

Peta (T)

Semiconductors; Test equipment

Representing one thousand million million, or 1,000,000,000,000,000. Peta is 10 to the 15th power.

Tesla (T)

Semiconductors; Test equipment

Unit of magnetic flux density. (1 tesla = 1 Wb/m^2).

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