20 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
Nyquist plot
Semiconductors; Test equipment
1. A plot of the real part versus the imaginary part of the frequency response function. For a single-degree-of-freedom system, the Nyquist plot is a circle. 2. The Nyquist plot is representation of ...
Accuracy
Semiconductors; Test equipment
1. The closeness of agreement between a test result and the accepted reference value.(ISO 5725-1) 2. Closeness of the agreement between the result of a measurement and a true value of the measurand. ...
Sag formula
Semiconductors; Test equipment
"Sag" is an abbreviation for "sagitta," the Latin word for "arrow," and refers to the height of a curve from the chord to the highest point.
Metre
Semiconductors; Test equipment
1) Any electrical or electronic measuring device. 2) In the metric system, it is the unit of length equal to 39.37 inches.
Waveform generation language (WGL)
Semiconductors; Test equipment
WGL is the de-facto standard for ATPG and vector generation. Most pattern development tools support WGL and there are third party tools that specialise in the conversion of WGL to various tester ...
Verilog change dump (VCD)
Semiconductors; Test equipment
Output from Verilog used for pattern generation. Typically this output has to be translated into a format that is readable by a tester. This translation process is typically performed by several ...
