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Test equipment
Industry: Semiconductors
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Test equipment
Gauss (unit)
Semiconductors; Test equipment
(G) - the cgs unit of magnetic flux density or magnetic induction (B), named after the German mathematician and physicist Carl Friedrich Gauss. One gauss is defined as one maxwell per square ...
Graphical device interface (GDI)
Semiconductors; Test equipment
The native graphical language of Windows. A GDI-compliant printer will print exactly what is displayed on a Windows screen without having to transpose it into a printer language. All the processing ...
Gallium arsenide
Semiconductors; Test equipment
(GaAs) - A 3:5 valence high-speed semiconductor formed from a mixture of gallium and arsenic. GaAs transistors are approximately eight times faster than their silicon equivalents and use ...
Gerber data stream information interchange (GDSII)
Semiconductors; Test equipment
An industry format describing the physical structure of the chip design and used to create mask tooling for chip manufacturing.
Fault tree analysis (FTA)
Semiconductors; Test equipment
An analysis approach in which each potential system failure is traced back to all faults that could cause the failure. It is a top-down approach, whereas the FMEA is a bottom-up approach.
Frequency shift keying (FSK)
Semiconductors; Test equipment
Modulation scheme for data communications using a limited number of discrete frequencies to convey binary information.
Giga (G)
Semiconductors; Test equipment
Represents one thousand million, or 1,000,000,000. Typically used to measure frequency in Hertz, but now measures the amount of memory in modern personal computers.
