Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Fundamental train frequency (FTF)

Semiconductors; Test equipment

The rotation frequency or rate of the cage supporting the rolling elements in an anti-friction bearing.

Gigahertz

Semiconductors; Test equipment

(GHz) - One billion (1,000,000,000) hertz (Hz)

Internet message access protocol (IMAP)

Semiconductors; Test equipment

A standard way of retrieving e-mail from a mail server. The main advantage of IMAP over older protocols such as POP3 is that users can manipulate remote mailboxes as if they were on a local machine.

Integrated logistics support (ILS)

Semiconductors; Test equipment

A unified and iterative approach to the management and technical activities needed to influence operational and materiel requirements and design specifications, define the support requirements best ...

Intermediate maintenance

Semiconductors; Test equipment

(I-Level Maintenance) - Maintenance in which the malfunctioning assembly is tested to determine the cause of the malfunction and isolate the failure to a SRU. Repair is effected by removal and ...

Internal JTAG or IEEE P1687 (IJTAG)

Semiconductors; Test equipment

This standard will develop a methodology for access to embedded test and debug features, (but not the features themselves) via the IEEE 1149.1 Test Access Port (TAP) and additional signals that may ...

Intermodulation distortion (IMD)

Semiconductors; Test equipment

A measure of the spurious signals resulting from unwanted multiplication of different input signals. This effect is contributed by non-linearities in the system. Again, heavy negative feedback can ...