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Test equipment

Contributors in Test equipment

Test equipment

Bypass capacitor

Semiconductors; Test equipment

A capacitor used to provide an AC ground at some point in a circuit. It is often a great concern in testing because polarised capacitors assembled in reverse are not detected by many testers. Some ...

Maintainability

Semiconductors; Test equipment

A characteristic of design and installation that provides inherently for the system to be retained or restored to a specified condition within a given time when the maintenance is performed using ...

Data acquisition

Semiconductors; Test equipment

A circuit that can digitise and process the output of sensors or signals in order to monitor, analyse and/or control systems and processes. Data acquisition can also filter, amplify, and other ...

EMI philtre

Semiconductors; Test equipment

A circuit or device containing series-inductive and parallel-capacitive components that provide a low impedance path for high-frequency noise around a protected circuit.

Lateral colour

Semiconductors; Test equipment

A chromatic aberration resulting in image size variation as a function of wavelength. Also known as chromatic difference of magnification.

Differentiator

Semiconductors; Test equipment

A circuit in which the output voltage is in proportion to the rate of change of the input voltage. A high pass RC circuit.

Mode

Semiconductors; Test equipment

A characteristic pattern in a vibrating system. All points reach their maximum displacements at the same instant.

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