Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Design for test (DFT)

Semiconductors; Test equipment

Design For Test is the practise of adding hardware hooks to integrated circuits in order to facilitate effective, inexpensive testing.

Built in self test (BIST)

Semiconductors; Test equipment

BIST essentially builds tiny tester models onto the integrated circuit so that it can test itself.

Range

Semiconductors; Test equipment

(1) The maximum and minimum allowable full-scale signal (input or output) that yields a specified performance level.

Logic built in self test (LBIST)

Semiconductors; Test equipment

A form of BIST targeted at testing random logic. Typically, this is done with PRPGs feeding scan logic and the outputs are connected to a MISRs. All commercial forms of LBIST require a full scan ...

Fault dictionary

Semiconductors; Test equipment

A fault dictionary contains the same information contained in a fault list, but include information about how the fault manifests itself including the error location and its effect on circuit ...

Fault list

Semiconductors; Test equipment

A fault list that contains every possible fault for consideration, but no information bout how the fault manifests itself under various circuit conditions and test conditions.