Test data In (TDI)

Test data In (TDI)

Serial test data shifted in with a default value of 1. A mandatory terminal of the TAP.

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Industry/Domain: Semiconductors
Category: Test equipment
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test data In (TDI)

Semiconductors; Test equipment

Serial test data shifted in with a default value of 1. A mandatory terminal of the TAP.

test data out (TDO)

Semiconductors; Test equipment

Serial test data shifted out with a default value of Z. This mandatory terminal of the TAP is only active during the shift operation.

high-pass filter

Semiconductors; Test equipment

(1) A math operation that emphasizes details in an image. (2) A circuit that attenuates low-frequency components in an analog signal.

bipolar

Semiconductors; Test equipment

(1) A signal that includes positive and negative values. (2) A type of semiconductor.

ground

Semiconductors; Test equipment

(1) An electrically neutral wire that has the same potential as the surrounding earth. Normally, a non-current-carrying circuit intended for safety. (2) A common reference point ...

low-pass filter

Semiconductors; Test equipment

(1) An operation that blurs details in an image. (2) A circuit that attenuates the high-frequency components in an analog signal.

electromagnetic compatibility (EMC)

Semiconductors; Test equipment

(1) The ability of electronic equipment to operate in an intended electromagnetic environment without degradation caused by interference. (2) The ability of equipment to operate ...

pixel

Semiconductors; Test equipment

(1) The fundamental picture element in a digital image. (2) The coordinate unit used to define the horizontal location of a pixel in an image. ("Pixel" is an acronym for "picture ...

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