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Atomic force microscopy (AFM)
Also known as scanning force microscopy; a method for mapping the surface of microscopic (e.g. cellular) and even submicroscopic (e.g. macromolecular) surfaces. As a sharp tip passes over the surface of an object, contact pressure is kept at a minimal constant value by an electronic feedback loop; the whole deflection of the cantilevered tip is measured, for example by deflection of a reflected laser beam.
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- Part of Speech: noun
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- Industry/Domain: Biology
- Category: Biochemistry; Molecular biology
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