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Test equipment

Contributors in Test equipment

Test equipment

In-system programmable (ISP)

Semiconductors; Test equipment

Ability to programme a device on the system board.

Multiple input / multiple output communication (MIMO)

Semiconductors; Test equipment

An abstract mathematical model for multi-antenna communication systems where the transmitter has multiple antennas capable of transmitting independent signals and the receiver is equipped with ...

Media delivery index (MDI)

Semiconductors; Test equipment

In video transmission over the internet, it provide useful insights into what is happening to a video data stream as it winds through the network. The MDI has two components: the Delay Factor (DF) ...

Manufacturing for design (MFD)

Semiconductors; Test equipment

Any technique used by the chip manufacturer to tailor the processes for a particular design to improve production yield. These techniques usually take the form of specific process recipe settings or ...

Mean downtime (MDT)

Semiconductors; Test equipment

The average elapsed time between losing Mission Capable status and restoring the system to at least partially mission capable status. Calculated as the ratio of total downtime over the number of ...

Model based reasoner (MBR)

Semiconductors; Test equipment

An algorithm that creates diagnostic conclusions by comparing measured values against propositions created from a model that is dynamically adjusted to match changes to the system.

Mission capable (MC)

Semiconductors; Test equipment

An assessment of a system's ability to perform its required tasks, in either a Fully Mission Capable (FMC) or Partially Mission Capable (PMC) status.

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