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Test equipment
Industry: Semiconductors
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Test equipment
General-purpose native jtAg tester (GNAT)
Semiconductors; Test equipment
An instrumentation port developed by Silicon and Software Systems to provide access to User Data Registers through the 1149.1 TAP on Xilinx FPGAs.
Global positioning system (GPS)
Semiconductors; Test equipment
A series of 24 geosynchronous satellites that continuously transmit their position. Used in personal tracking, navigation and automatic vehicle location technologies.
Graphical user interface (GUI)
Semiconductors; Test equipment
A software interface that is Windows based. In test, National Instrument's LabVIEW, Agilent's VEE and Capital Equipment's TestPoint are commonly used GUIs
General purpose interface bus (GPIB)
Semiconductors; Test equipment
The common name for the communications interface system defined in ANSI/IEEE Standard 488.1-1987.
Magnetic field strength (H)
Semiconductors; Test equipment
A radiated wave's current gradient measured in amperes/m. 1 A/m = 0.0125 oersteds 1 oersted = 79.6 A/m
Pi
Semiconductors; Test equipment
(Greek letter pi) - Value representing the ratio between the circumference and diameter of a circle and equal to approximately 3.142.
Industrial scientific and medical bands (ISM bands)
Semiconductors; Test equipment
This spectrum is freely available worldwide with only a few basic equipment characteristics regulated (i.e. must be spread spectrum and low power). The major disadvantage of this band, especially for ...
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