Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

General-purpose native jtAg tester (GNAT)

Semiconductors; Test equipment

An instrumentation port developed by Silicon and Software Systems to provide access to User Data Registers through the 1149.1 TAP on Xilinx FPGAs.

Global positioning system (GPS)

Semiconductors; Test equipment

A series of 24 geosynchronous satellites that continuously transmit their position. Used in personal tracking, navigation and automatic vehicle location technologies.

Graphical user interface (GUI)

Semiconductors; Test equipment

A software interface that is Windows based. In test, National Instrument's LabVIEW, Agilent's VEE and Capital Equipment's TestPoint are commonly used GUIs

General purpose interface bus (GPIB)

Semiconductors; Test equipment

The common name for the communications interface system defined in ANSI/IEEE Standard 488.1-1987.

Magnetic field strength (H)

Semiconductors; Test equipment

A radiated wave's current gradient measured in amperes/m. 1 A/m = 0.0125 oersteds 1 oersted = 79.6 A/m

Pi

Semiconductors; Test equipment

(Greek letter pi) - Value representing the ratio between the circumference and diameter of a circle and equal to approximately 3.142.

Industrial scientific and medical bands (ISM bands)

Semiconductors; Test equipment

This spectrum is freely available worldwide with only a few basic equipment characteristics regulated (i.e. must be spread spectrum and low power). The major disadvantage of this band, especially for ...