Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Bipolar junction transistor (BJT)

Semiconductors; Test equipment

A three terminal device in which emitter to collector current is controlled by base current.

Built In test (BIT)

Semiconductors; Test equipment

An integral capability of the mission system or equipment which provides an automated test capability to detect, diagnose or isolate failures.

Board level self-test (BLST)

Semiconductors; Test equipment

A form of BIT or BIST specifically targeting the functionality of the board in which the BLST resides.

Bits per second (BPS)

Semiconductors; Test equipment

Used to denote the speed of data transfer. Used interchangable with "baud" in most cases.

Built In test equipment (BITE)

Semiconductors; Test equipment

A permanently mounted device that is used expressly for testing an equipment or system.

A situation where the silicon IC chip is mounted directly to the electronic assembly substrate or PWB without an intermediate packaging step. connexions between the chip and the board are generally ...

Cost of poor quality (COPQ)

Semiconductors; Test equipment

The total cost of repair, rework, scrap, service calls, warranty claims and write-offs from obsolete finished goods as a percentage of annual sales. Experts have estimated that COPQ typically amounts ...