10 Terms
Home > Industry/Domain > Semiconductors > Test equipment
Test equipment
Industry: Semiconductors
Add a new termContributors in Test equipment
Test equipment
Parameter
Semiconductors; Test equipment
A quantity in a function (or subroutine), or at a device port, the value of which is selected according to circumstances. Parameters are distinguished from variables, recorded measurements, ...
Polling
Semiconductors; Test equipment
A round-robin canvassing of inputs to a computer to determine which ones are active. In most cases, polling is synchronised in software to a clock or external trigger.
Characterization test
Semiconductors; Test equipment
A series of tests designed to determine the operating regions and reliability of a device under varied operating conditions.
Bandwidth (BW)
Semiconductors; Test equipment
A range of frequencies over which a system works without degrading the original signal.
Active load
Semiconductors; Test equipment
A programmable circuit that acts as a pullup or pulldown load when connected to a DUT pin.
File transfer protocol (FTP)
Semiconductors; Test equipment
A protocol that transfers files over the Internet.
Macro
Semiconductors; Test equipment
A set of programme steps combined by a user or a programmer that act as a single and more powerful programme step.
