Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Asynchronous

Semiconductors; Test equipment

An action that takes place at an arbitrary time, without synchronisation to a reference timer or clock.

Tester

Semiconductors; Test equipment

An assembly of apparatus used for evaluating semiconductor devices.

Pinlist

Semiconductors; Test equipment

An array of pin-name/channel-number pairs.

Though beyond the scope of this glossary.

Semiconductors; Test equipment

DFT technique where a pin's output is wrapped back in to it's input (or the input of another pin). This can allow some testing of pins that are not contacted directly by the tester. Note: This ...

Wrap I/O

Semiconductors; Test equipment

DFT technique where a pin's output is wrapped back in to it's input (or the input of another pin). This can allow some testing of pins that are not contacted directly by the tester. Note: This ...

Electronic design automation (EDA)

Semiconductors; Test equipment

EDA refers to the design tools and environment utilised to render the logic, schematics, insert scan, insert BIST, etc. for a new chip design.

Design for manufacturing (DFM)

Semiconductors; Test equipment

Term used to define activities done during the design process (by Designers) to ensure that the design is optimised for the Fab Process that will create the product.