28 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
Device under test (DUT)
Semiconductors; Test equipment
This is the target device being tested. Less frequently referred to as "CUT" (circuit under test).
Fault dominance
Semiconductors; Test equipment
Dominance is the condition in which the deviation at the output caused by one fault is negligible compare with the deviation at the same output, but caused by a different fault.
Conducted emission
Semiconductors; Test equipment
Electromagnetic energy that is propagated along a conductor. This energy is called "conducted interference" if it is undesired.
Scan
Semiconductors; Test equipment
DFT technique where traditional functional logic is reconfigured into "chains" for direct test access to internal nodes.
Source current (active load)
Semiconductors; Test equipment
Conventional current flow out of a DUT with the active load as pull-down.
Susceptibility
Semiconductors; Test equipment
The characteristic of electronic equipment that permits undesirable responses when the equipment is subjected to electromagnetic radiation.
Autorange
Semiconductors; Test equipment
The change of the measurement range by an automatic instrument so it can report with best accuracy a quantity at its input.
