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Test equipment

Contributors in Test equipment

Test equipment

PC card

Semiconductors; Test equipment

The name of version 3.0 of the PCMCIA form factor.

Polarisation

Semiconductors; Test equipment

The orientation of the field vector in a radiated field.

Automatic Test Pattern Generation (ATPG)

Semiconductors; Test equipment

Tool-based approach to test pattern or programme development that relies heavily on the design database. DFT and ATPG go hand-in-hand.

Tolerance

Semiconductors; Test equipment

Tolerance is the deviation allowed for a component ( for example, R,C,gm,Cgs,etc. ) of its measured output, such as voltage magnitude. For component variation, tolerance is the deviation of an ...

Image processing

Semiconductors; Test equipment

Transforming a source image into an improved image that supplies specific properties. For example, edge detection is an image-processing method.

Format

Semiconductors; Test equipment

To produce a waveform from pattern data and timing information in accordance with a format mode.

Trace

Semiconductors; Test equipment

To monitor the execution of a programme and report the sequence of actions carried out.

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