Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

American wire gauge (AWG)

Semiconductors; Test equipment

A gauge that assigns a number value to the diameter of a wire.

Complex instruction set computer (CISC)

Semiconductors; Test equipment

A design approach for microprocessors and microcontrollers which employs relatively complex instructions that execute over multiple clock cycles. A programme written using CISC instructions requires ...

Comité Européen de Normalisation Electrotechnique (CENELEC)

Semiconductors; Test equipment

Comité Européen de Normalisation Electrotechnique (European Committee for Electrotechnical Standardization), located in Brussels, in charge of harmonising electro-technical standards in the frame of ...

Column grid array (CGA)

Semiconductors; Test equipment

A packaging technology similar to a pad grid array, in which a device's external connexions are arranged as an array of conducting pads on the base of the package. However, in the case of a column ...

Common mode rejection ratio (CMRR)

Semiconductors; Test equipment

A measure of an instrument's ability to ignore or reject interference from a signal that is common to the instrument's input terminals, but relative to ground. (Expressed in decibels.)

Component maturity model integration (CMMI)

Semiconductors; Test equipment

A software development standard spearheaded by the Department of defence (DoD) to improve the quality of the software developed by its contractors.

Chip mount technology (CMT)

Semiconductors; Test equipment

Any packaging or electronic assembly manufacturing technology, such as TOB, COB, or flip chip, that connects bare (unpackaged) IC chips to the substrate.