5 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
Integrated circuit (IC)
Semiconductors; Test equipment
A circuit housed in a chip form. The two main IC configurations are through-hole (with pins that penetrate across the circuit board) and surface mount technology (SMT), which mount on the surface of ...
In-circuit tester (ICT)
Semiconductors; Test equipment
An ATE that employs a guarding principle to measure the performance of individual components by electrically isolating them from the surrounding circuitry.
Integrated health management (IHM)
Semiconductors; Test equipment
A health management process that has been integrated into the system, or device whose health is being monitored/managed.
Interconnection device (ID)
Semiconductors; Test equipment
Consists of the hardware necessary to interface the UUT to the ATE being used to test the UUT.
Local interconnect network (LIN)
Semiconductors; Test equipment
LIN is a single-wire serial communications protocol based on the common SCI (UART) byte-word interface. UART interfaces as available as low cost silicon module on almost all micro-controller and can ...
Level of repair analysis (LORA)
Semiconductors; Test equipment
An analytical methodology used to assist in developing maintenance concepts and establishing the maintenance level at which components will be replaced, repaired, or discarded based on ...
Local oscillator (LO)
Semiconductors; Test equipment
The oscillator generating the heterodyning frequency for the mixer stage(s). The abbreviation LO is also used to indicate the frequency of the heterodyning signal (e.g. 1st LO). In fundamental ...
