Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Logic modelling

Semiconductors; Test equipment

(LogMod) - The name used by Ralph A. Depaul, Jr. to refer to the causal modelling technique that he invented in the 1950s and which would later become known as dependency modeling.

Loss of vehicle (LOV)

Semiconductors; Test equipment

The measurement of probability of a failure causing loss of vehicle, platform or equipment and is specified as a level 4 criticality in the FMECA.

Loss of mission (LOM)

Semiconductors; Test equipment

The measurement of probability of a failure causing loss of mission or operation and is specified as a level 3 criticality in the FMECA.

Loss of life (LOL)

Semiconductors; Test equipment

The measurement of probability of a failure causing loss of life and is specified as a level 5 criticality in the FMECA.

Last In first out (LIFO)

Semiconductors; Test equipment

A memory device in which data is read out in the reverse order to which it was written in.

Hertz

Semiconductors; Test equipment

(lower-case h, but abbreviated Hz) The unit of frequency. Formerly cps for cycles per second.

Multitasking machines (MTM)

Semiconductors; Test equipment

In the machine-tool industry, these multitaskers--which can perform simultaneous milling and turning operations--are rising stars. While they still account for a modest portion of overall machine ...