Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Organic solder preservative (OSP)

Semiconductors; Test equipment

Layers of organic coatings applied to entire board surfaces to prevent oxidation and to retain solderability.

Power-up BIT (PBIT)

Semiconductors; Test equipment

Comprehensive tests of hardware functionality extending as close to the edge of a module as possible.

Programmable array logic (PAL)

Semiconductors; Test equipment

A programmable logic device in which the AND array is programmable but the OR array is pre-defined.

(1) A hole in a double-sided or multilayer board that is used to accommodate a through-hole component lead and is plated with copper. (2) An alternative name for the lead through-hole technique for ...

Pseudo random binary sequence (PRBS)

Semiconductors; Test equipment

A set of sequences,which consists of a stream of numbers that appear random but follow a predictable mathematical pattern, repeated at a random rate; used to create random noise in digital systems.

Pseudo-random word stream (PRWS)

Semiconductors; Test equipment

A word stream that defines how multiple pseudorandom bit streams are presented across all of the signal generator's parallel outputs, often used when testing serializers or multiplexers.

Phase-shift keying (PSK)

Semiconductors; Test equipment

Digital modulation where the carrier switches between two phase settings. In PSK, a "0" is imparted by sending a signal of the same phase as the previous signal, while a "1" bit is represented by ...