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Atomic force microscope (AFM)

An instrument able to image surfaces to molecular accuracy by mechanically probing their surface contours. A kind of proximal probe. .... A device in which the deflection of a sharp stylus mounted on a soft spring is monitored as the stylus is moved across a surface. If the deflection is kept constant by moving the surface up and down by measured increments, the result (under favourable conditions) is an atomic-resolution topographic map of the surface. Also termed a scanning force microscope. See How AFM Works, What is an Atomic Force Microscope? and Window on a Small World

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  • Category: Nanotechnology
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