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Test equipment
Industry: Semiconductors
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Test equipment
Antenna factor (AF)
Semiconductors; Test equipment
The term (AF) is used to define the antenna calibration relationship required for making accurate radiated emission measurements. The unknown electric field strength (E in V/m) is obtained by ...
Arbitrary function generator (AFG)
Semiconductors; Test equipment
The arbitrary/function generator (AFG) serves a wide range of stimulus needs; in fact, it is the prevailing signal generator architecture in the industry today. Typically, this instrument offers ...
Protocol analyzer
Semiconductors; Test equipment
Software programmes (usually) or computer hardware that can intercept and log traffic passing over a digital network or part of a network. As data streams travel back and forth over the network, the ...
Network sniffers
Semiconductors; Test equipment
Software programmes (usually) or computer hardware that can intercept and log traffic passing over a digital network or part of a network. As data streams travel back and forth over the network, the ...
Application development environment (ADE)
Semiconductors; Test equipment
An environment which provides users various software development tools for the development of automated test systems. Examples of ADEs include National Instruments LabVIEW, Agilent VEE, Microsoft ...
Inherent availability (AI)
Semiconductors; Test equipment
The ratio of operational "up time" to "down time" measured as MTBF over MTBF + MTTR. AI is based on the capability of the design to perform reliably (MTBF) and, in case of failure, the time required ...
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