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Test equipment

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Test equipment

Frequency division multiplex (FDM)

Semiconductors; Test equipment

Transmission of two or more signals over a common path by using a different frequency band for each signal.

Field effect transistor (FET)

Semiconductors; Test equipment

A transistor whose control, or gate, signal creates an electro-magnetic field which turns the transistor ON or OFF.

Fraction of false alarm (FFA)

Semiconductors; Test equipment

The percentage of fault detections that are not due to the existence of faults.

Full scale deflection (FDS)

Semiconductors; Test equipment

Deflection of a meter's pointer to the farthest position on the scale.

Gigatransfers per second

Semiconductors; Test equipment

(GT/s) - A bus speed specification that is somewhat different than the gigabit per second (Gbps) commonly used. The difference has to do with the encoding of the data. Because PCIe is a serial bus ...

Global system for mobile (GSM)

Semiconductors; Test equipment

A standard for digital mobile telephones widely used in Europe. GSM and its variants are rapidly being adopted elsewhere in the world, especially in Asia and Australasia. It is used on the 900MHz and ...

General purpose electronic test equipment (GPETE)

Semiconductors; Test equipment

Test equipment that has the capability, without modification, to generate, modify, or measure a range of electronic functions required to test several equipments or systems of basically different ...

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