Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Design for yield (DFY)

Semiconductors; Test equipment

A Design for Manufacturing (DFM) technique which alters the design in a manner that is more likely to produce higher chip yields.

Dual In-line (DIL)

Semiconductors; Test equipment

Component shape with two parallel rows of connexion leads.

The process of identifying the faulty replaceable unit or group of units, whose replacement will repair the system. The replaceable unit in a system is the module(s); in a module, the board(s); on a ...

Forward error correction (FEC)

Semiconductors; Test equipment

Methodology that uses error correction coding to transmission. This is the opposite of ARQ (automatic repeat request) which uses retransmission of data. FEC CODE: RATE 1/3 is a simple Forward Error ...

Functional hazard analysis (FHA)

Semiconductors; Test equipment

An analysis of the effects, risk, severity and probability of potential faults that is performed during the specification and design stages, typically before failure modes are identified. The FHA ...