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Test equipment
Industry: Semiconductors
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Test equipment
Operational test sites
Semiconductors; Test equipment
Test sites on a multisite test head declared on to the test program. This assures that a test site is usableÑno broken socket, channel runs exist. An operator can declare test sites non-operational.
Automatic pattern generator (APG)
Semiconductors; Test equipment
Tester resource that generates vectors on-the-fly, programmatically (algorithmically) , usually for memory test.
Parallel test
Semiconductors; Test equipment
Testing more than one device simultaneously. By convention, this is usually assumed to be identical tests on identical devices. (contrast to Concurrent Test).
Diagnostic tests
Semiconductors; Test equipment
Tests intended to determine the cause of a possible malfunction and to suggest a repair strategy.
Source voltage (active load)
Semiconductors; Test equipment
Terminal voltage at a DUT acting as current source.
Sink voltage (active load)
Semiconductors; Test equipment
Terminal voltage at a DUT acting as current sink.
Shutdown
Semiconductors; Test equipment
The (usually graceful) termination of operation-system execution on a processor (or system of processors).
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