Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Decibel voltage (dBm V)

Semiconductors; Test equipment

DB referred to 1 millivolt across 75 ohms

Dynamic random access memory (DRAM)

Semiconductors; Test equipment

Memory that consists of small capacitors for each bit of memory. Since capacitors do not hold a charge indefinitely, DRAM must be constantly refreshed to avoid losing its contents. Also, the process ...

Data register scan

Semiconductors; Test equipment

(DR scan) - A scan operation that includes shifting new data into test data registers from the TDI buffers and shifting captured data out into the TDO buffers while the TAP controller is in Shift-DR ...

Differential nonlinearity (DNL)

Semiconductors; Test equipment

A measure in LSB of the worst-case deviation of code widths from their ideal value of 1 LSB. A DNL lower limit specification of -1 LSB guarantees no missing codes. A maximum code width can be ...

Operational dependability ((Do)

Semiconductors; Test equipment

The ratio of the Mean Time Between Critical Failures (MTBCF) over the sum of the MTBCF and the Mean Time to Restore Function (MTTRF). This measure is used to determine the degree to which the system ...