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Test equipment

Contributors in Test equipment

Test equipment

Test mode select (TMS)

Semiconductors; Test equipment

Serial input control signal with a default value of 1. A mandatory terminal of the TAP.

Test reset (TRST)

Semiconductors; Test equipment

Asynchronous TAP controller reset with a default value of 0, the optional terminal of the TAP.

Thin quad flat pack (TQFP)

Semiconductors; Test equipment

Low profile, surface mount package.

Bode plot

Semiconductors; Test equipment

1. A plot of the frequency response function that includes log magnitude versus frequency plus phase versus frequency. For a single-degree of freedom, the magnitude is a maximum at the natural ...

You can't protect against stupid (YCPAS)

Semiconductors; Test equipment

This is the abbreviation for every programmer's worst nightmare, You Can't Protect Against Stupd! Every programmer will acknowledge that in his programming career, at least one situation came about ...

Uncertainty of a certified value

Semiconductors; Test equipment

1. Estimate attached to a certified value of a quantity which characterises the range of values within which the true value is asserted to lie with a stated level of confidence.(ISO Guide 30:1992) 2. ...

Apparent yield (Ya)

Semiconductors; Test equipment

Unlike actual yield that is the quality or percentage of good products, apparent yield is what the tester says the quality is. Since a tester generally does not have a 100% fault coverage, the ...

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