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Test equipment
Industry: Semiconductors
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Test equipment
Flaw detection
Semiconductors; Test equipment
An image-analysis technique that examines an object for unwanted features of unknown shapes at unknown positions.
Impulse
Semiconductors; Test equipment
An electromagnetic pulse of short duration shorter than one cycle at the highest frequency being considered.
Monochrome
Semiconductors; Test equipment
An image represented by a single color. Generally, a monochrome image is presented as white on a black background.
Time-out
Semiconductors; Test equipment
An error event that occurs after a maximum time interval for an expected event.
Background
Semiconductors; Test equipment
In a personal computer, programmed operations that take place without direct operator intervention; for example, network operations, printing, and display refreshing.
Foreground
Semiconductors; Test equipment
In a personal computer, the activity subject to direct operator intervention. Background activities may be running on the computer simultaneously.
Counter (1)
Semiconductors; Test equipment
In software, a memory location used to store a count of certain occurrences. (2) In hardware, a circuit that counts events.
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