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Test equipment
Industry: Semiconductors
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Test equipment
Region of interest
Semiconductors; Test equipment
In inspection, the area inside defined boundaries of an image that you want to analyze.
Radio-frequency interference (RFI)
Semiconductors; Test equipment
High-frequency interference with radio reception.
Histogram
Semiconductors; Test equipment
In inspection, the graphical representation of the gray-scale values found in an image.
Line
Semiconductors; Test equipment
In imaging, the coordinate that defines the vertical location of a pixel in an image.
Frame
Semiconductors; Test equipment
In inspection, the total area of the picture that is scanned by a camera.
Feature
Semiconductors; Test equipment
In inspection, any characteristic of an image or a region in an image.
Defect
Semiconductors; Test equipment
Term used to reference specific flaw(s); physical or chemical imperfection, on a manufactured device. Most defects can be detected and measured by a Failure Analysis group. Specific devices that do ...
