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Test equipment

Contributors in Test equipment

Test equipment

Operational maintenance

Semiconductors; Test equipment

(O-Level Maintenenace) - Maintenance in which the repair action consists of the removal and replacement of the malfunctioning assembly (LRU, black box, equipment). In both two and three-level ...

On-chip emulation (OnCE)

Semiconductors; Test equipment

A Freescale JTAG command which makes a TAP enter a special mode where the IR holds OnCE debugging commands for operations such as single stepping, breakpointing, and accessing registers or memory.

Base copper weight

Semiconductors; Test equipment

Coated copper layer on the board. It can either be characterised by weight or thickness of the coated copper layer. For instance, 0.5, 1 and 2 ounces per square foot are equivalent to 18, 35 and 70 ...

Copper foil

Semiconductors; Test equipment

Coated copper layer on the board. It can either be characterised by weight or thickness of the coated copper layer. For instance, 0.5, 1 and 2 ounces per square foot are equivalent to 18, 35 and 70 ...

Operational amplifier (OpAmp)

Semiconductors; Test equipment

A high gain DC amplifier that has a high input impedance and a low output impedance. Op-amps are the most basic type of linear integrated circuits

Quadrature sensitivity

Semiconductors; Test equipment

(Or side or lateral motion or crosstalk sensitivity) of a vibration sensor is its sensitivity to motion perpendicular to the sensor's principal axis. Commonly expressed in % of principal axis ...

Operating system (OS)

Semiconductors; Test equipment

The collective name for the set of master programmes that control the core operation and the base-level user-interface of a computer.

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