Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Programmable logic array (PLA)

Semiconductors; Test equipment

The most user-configurable of the traditional programmable logic devices, because both the AND and OR arrays are programmable.

Parallel In serial out (PISO)

Semiconductors; Test equipment

Refers to a shift register in which the data is loaded in parallel and read out serially.

Phase locked loop (PLL)

Semiconductors; Test equipment

An analogue circuit used to perform clock management functions on and off-chip.

PCI extensions for instrumentation (PXI)

Semiconductors; Test equipment

A rugged PC-based platform for measurement and automation systems. PXI combines PCI electrical-bus features with the rugged, modular, Eurocard packaging of CompactPCI, and then adds specialised ...

The amount of mechanical gain of a structure when excited at a resonant frequency. The ratio of the amplitude of the steady state solution (amplitude at resonance) to the static deflection for the ...

Pulse-width modulation (PWM)

Semiconductors; Test equipment

Often used in digital audio systems. As its name implies, it is applicable to pulse waveforms only. With PWM, the modulating signal causes the active pulse width (duty cycle, explained earlier) of ...