10 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
Virtual instrument (VI)
Semiconductors; Test equipment
A combination of hardware and/or software elements, typically used with a PC, that has the functionality of a classic standalone instrument.
Value change dump (VCD)
Semiconductors; Test equipment
A standard file format used to log changes to variable values, such as the values of signals, in a file during a simulation session.
Very large scale integration (VLSI)
Semiconductors; Test equipment
A circuit classification that contains more gates than an LSI device.
Very fine pitch (VFP)
Semiconductors; Test equipment
The center-to-center lead distance of surface mount packages that are between 0.012 inch and 0.020 inch.
Data bus
Semiconductors; Test equipment
A bi-directional set of signals used by a computer to convey information from a memory location to the central processing unit and vice versa. More generally, a set of signals used to convey data ...
Macro block
Semiconductors; Test equipment
A block of standard cells and hard IP that has previously been automatically placed and routed, turning the macro block into a higher level hard-IP block that can go into a cell library.
Product of sums
Semiconductors; Test equipment
A Boolean equation in which all the maxterms corresponding to the lines in the truth table for which the output is a logic 0 are combined using AND operators.
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