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Test equipment

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Test equipment

Product lifecycle management (PLM)

Semiconductors; Test equipment

Used to track products as they're developed, to "manage the mountains of data surrounding engineering changes," and finally "to feed product information to enterprise resource planning (ERP) ...

Phase modulation (PM)

Semiconductors; Test equipment

In a phase modulated signal, the reference phase of the carrier varies in proportion to the instantaneous amplitude of the modulating baseband signal. This is similar to FM, but the frequency ...

Plastic leaded chip carrier (PLCC)

Semiconductors; Test equipment

A plastic IC package for surface mounting applications that has leads, generally "J" leads, on all fours sides (sometimes given as PCC or PLDCC).

Programmable logic device (PLD)

Semiconductors; Test equipment

The generic name for a device constructed in such a way that the designer can configure, or "program" it to perform a specific function.

Power line cycle (PLC)

Semiconductors; Test equipment

As the name implies, this is the length of time it takes the AC power supply to complete one cycle (20 ms for 50 Hz systems and 16.7 ms for 60 Hz systems).

Peak inverse voltage (PIV)

Semiconductors; Test equipment

The maximum rated value of a AC voltage acting in the direction opposite to that in which a device is designed to pass current.

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