3 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
Packet
Semiconductors; Test equipment
A basic message unit for communication across a network. A packet usually includes routing information, data, and (sometimes) error detection information.
Eutectic bond
Semiconductors; Test equipment
A bond formed when two pieces of metal, or metal-coated materials, are pressed together and vibrated at ultrasonic frequencies.
Latch
Semiconductors; Test equipment
A basic logic function that stores the input value of a signal. Unlike a flip flop, the output directly reflects the input value when enabled.
Bearer (B) channel
Semiconductors; Test equipment
A 64 kilobit-per-second (Kbps) circuit switched channel used for voice or data.
Solder wick
Semiconductors; Test equipment
A band of wire removes molten solder away from a solder joining or a solder bridge or just for desoldering.
Flip flop
Semiconductors; Test equipment
A basic logic function that stores the input value of a signal when triggered by the clock input.
Electromagnetic compatibility (EMC)
Semiconductors; Test equipment
(1) The ability of electronic equipment to operate in an intended electromagnetic environment without degradation caused by interference. (2) The ability of equipment to operate in its ...
