Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Design of experiment (DOE)

Semiconductors; Test equipment

Planning and conducting experiments and evaluating the results. The outcome of a design of experiment includes a mathematical equation predicting the interaction of the factors influencing a process ...

Delayed non-return-to-zero (DNRZ)

Semiconductors; Test equipment

A digital format similar to NRZ, except that the waveform switches to a "1" after a specified delay time.

Digital multimeter (DMM)

Semiconductors; Test equipment

The digital multi-meter is an instrument capable of measuring several electrical parameters in various ranges.

Double pole double throw (DPDT)

Semiconductors; Test equipment

A double-pole double-throw (DPDT) relay has two poles, each with two simultaneously controlled throws

Design rules checking (DRC)

Semiconductors; Test equipment

In testing, this refers to the process of simulating design conditions to determine proper operation.

Equipment replaceable unit or replaceable unit (ERU)

Semiconductors; Test equipment

The lowest assembly or individual part that can be fault detected, isolated, removed, replaced and verified to be functional at organisational level without disassembly of the equipment to which it ...

Engineering units (EU)

Semiconductors; Test equipment

The units in which a measurement is made; for instance velocity may be expressed in millimetres per second, miles per hour, or furlongs per fortnight, depending on the use to which the data will be ...