Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Environmental stress screening (ESS)

Semiconductors; Test equipment

A post-production process in which 100% of produced units are subjected to stresses more severe than anticipated in service. The object is to precipitate latent defects into recognisable failures, so ...

Equivalent time sampling (ETS)

Semiconductors; Test equipment

Equivalent-time sampling is a method of reconstructing the signal based on a series of triggered waveforms that are each acquired in single shot mode. The advantage of ETS is that it offers a higher ...

Erasable programmable read only memory (EPROM)

Semiconductors; Test equipment

An integrated circuit that stores p rograms and data in many embedded systems. EPROM can only be programmed once. To erase an EPROM's contents, it must be exposed to intense ultraviolet light for ...

Embedded test controller (ETC)

Semiconductors; Test equipment

If some, or all of the functionality of a runtime-control Test Manager is built into the UUT, then this is referred to as an Embedded Test Controller (ETC), and defined to be the combination of an ...

Electrostatic discharge (ESD)

Semiconductors; Test equipment

A test, whereby, the unit under test subjected to some level of static electricity. Some organisations have their own ESD requirements which hardware must meet and some countries have laws regulating ...

Effective radiated power (ERP)

Semiconductors; Test equipment

The product of a transmitter power output and the antenna gain, taking into consideration any losses from the transmission line, connectors, couplers, etc.