Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Test clock (TCK)

Semiconductors; Test equipment

Dedicated Test Clock. This mandatory terminal of the TAP is driven by the clock that controls the synchronous operation of the TAP.

Test data In (TDI)

Semiconductors; Test equipment

Serial test data shifted in with a default value of 1. A mandatory terminal of the TAP.

An instrument which allows modulation analysis of modern digital signals. The instrument is similar to that of an oscilloscope, however; the VSA allow the additional analysis of both the In-phase (I) ...

Vapour phase soldering (VPS)

Semiconductors; Test equipment

A surface mount process in which a substrate carrying components attached by solder paste is lowered into the vapor-cloud of a tank containing boiling hydrocarbons. This melts the solder paste ...

VHSIC hardware description language (VHDL)

Semiconductors; Test equipment

A hardware description language developed in the 1980s by IBM, Texas Instruments, and Intermetrics under US government contract for the Department of Defense's VHSIC (Very High Speed Integrated ...

Virtual instrument software architecture (VISA)

Semiconductors; Test equipment

A standard I/O library that provides a single multivendor foundation for instrumentation software. Specifically, VISA provides an I/O API for communicating over a variety of bus interfaces, including ...

VHDL initiative toward ASIC libraries (VITAL)

Semiconductors; Test equipment

This VHDL industry standard defines how simulation models should be created to allow simulators to work consistently. Xilinx includes VITAL libraries in the software tools.