Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Circuit mil area (CMA)

Semiconductors; Test equipment

A unit of area equal to the area of a circle whose diameter is one mil (0.001 inch). Used chiefly in specifying cross-sectional areas of conductors.

Complementary metal oxide semiconductor (CMOS)

Semiconductors; Test equipment

A family of integrated circuits characterised by low power consumption.

CAD framework initiative (CFI)

Semiconductors; Test equipment

A consortium of EDA tool companies tasked with the development of framework standards for EDA tools.

Digital video / versatile disc (DVD)

Semiconductors; Test equipment

DVD Technology provides storage capacity that is about 6-7 times greater than that of CD technology with the same aerial space. It provides multiple languages on movies, with multiple language ...

A form of circuit board in which a special computer-controlled wiring machine ultrasonically bonds extremely fine insulated wires into the surface layer of the board. This discipline has enjoyed only ...

Embedded boundary scan test (EBST)

Semiconductors; Test equipment

Embedded BST means that an Embedded Test Controller based on an available processor located within the UUT becomes responsible for executing test and configuration operations. The controller uses a ...

Dual tone multi frequency (DTMF)

Semiconductors; Test equipment

The sounds made by a phone's keypad when a button is pressed. Each button emits a sound that is actually the combination of two specific sounds in order to minimise the possibility of an incorrect ...