Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Dielectric breakdown (DWV)

Semiconductors; Test equipment

The insulation barrier is missing and only a small air gap keeps metal conductors from shorting. The tester detects an electrical arc when high voltage is applied between these poorly insulated ...

Diode transistor logic (DTL)

Semiconductors; Test equipment

Logic gates implemented using particular configurations of diodes and bipolar junction transistors. For the majority of today's designers, diode-transistor logic is of historical interest only.

Direct rambus DRAM (DRDRAM)

Semiconductors; Test equipment

A DRAM which uses the proprietary Rambus interface.

Electrocardiograph (ECG )

Semiconductors; Test equipment

An instrument used to make heartbeat measurements

Electric field (E)

Semiconductors; Test equipment

The potential gradient of a radiated wave measured in volts/m.

Federal communications commission ratings (FCC ratings)

Semiconductors; Test equipment

Among other duties, the FCC is responsible for rating personal computers and other equipment as either Class A or Class B. The ratings indicate how much radiation a personal computer emits. Almost ...

Fault detection (FD)

Semiconductors; Test equipment

Presence of a fault is detected by observation of one or more discrepancies. Because of the complex relationship between faults and discrepancies, more than one fault may be suspected when a ...