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Test equipment

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Test equipment

frequency division multiple access (FDMA)

Semiconductors; Test equipment

A digital radio technology that divides the available spectrum into separate radio channels. Generally used in conjunction with Time Division Multiple Access (TDMA) or Code Division Multiple Access ...

scanning speed

Semiconductors; Test equipment

Form of exploration where the change of data and sample are produced to nominal operating frequency. Structure and operation of synchronization can either be verified with this type of screening ...

Field of view

Semiconductors; Test equipment

The area of the object under view as represented at the focal plane of a camera.

lot

Semiconductors; Test equipment

In device production, a group of semiconductor devices, usually from the same production run, treated as a unit.

Voltage-to-frequency converter (VFC)

Semiconductors; Test equipment

A device that converts an analogue input voltage into a sequence of digital pulses with a frequency that is proportional to the input voltage.

Comparator

Semiconductors; Test equipment

A circuit whose output is a digital logic level that depends on whether its input signal is above or below a threshold at a specified time interval.

Current loop

Semiconductors; Test equipment

A communications method that transmits data as current flow over relatively long distances and through environments with relatively high noise.

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