10 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
Test access port (TAP)
Semiconductors; Test equipment
Part of the JTAG standard, the TAP is a 4 (or optionally 5) pin port to enable boundary scan.
Averaging
Semiconductors; Test equipment
Mathematically smoothing the results of several measurements by adding them and dividing by the number of samples.
Cross modulation
Semiconductors; Test equipment
Modulation of a desired signal by an undesired signal. This is a special case of inter modulation.
Time stamp
Semiconductors; Test equipment
Information added to a unit of data to indicate the time at which it was processed.
File name
Semiconductors; Test equipment
Part of the identification used to locate a file on a volume.
Baseband
Semiconductors; Test equipment
In video and audio transmissions, a signal that is unmodulated.
