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Test equipment
Industry: Semiconductors
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Test equipment
Global system for mobile communications (GSM)
Semiconductors; Test equipment
A pan-European standard for digital cellular radio. Originally known as Groupe Spéciale Mobile.
Contrast
Semiconductors; Test equipment
A measure of brightness content in an image. High contrast implies mainly dark-black and bright-white content; low contrast implies a small spread of grey values.
Mismatch
Semiconductors; Test equipment
A non ideal coupling of two circuits. The part of the signal that does not pass through the coupling gets reflected and leads to measurement error.
Wafer map
Semiconductors; Test equipment
A plot of the viable dice on a wafer showing pass/fail information, parameter variation, or some other characteristic.
Die
Semiconductors; Test equipment
A piece of semiconductor with circuitry fabricated on it; one location on a wafer; compare chip.
Sensitivity
Semiconductors; Test equipment
A measure of the minimum change in an input signal that an instrument can detect.
Crosstalk
Semiconductors; Test equipment
A phenomenon in which one or more signals interfere with another signal.
