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Test equipment

Contributors in Test equipment

Test equipment

Interrupt

Semiconductors; Test equipment

A signal that requires immediate attention from a computer's CPU.

Java

Semiconductors; Test equipment

A subset of the C++ language specifically meant for running applications on the Web.

Bit map

Semiconductors; Test equipment

A set of values that specify colours or grey levels in an image.

Open area

Semiconductors; Test equipment

An open and flat test site at which electromagnetic-interference measurements are taken and at which effects from power wires, buildings, and underground cables are negligible. Ambient radiation must ...

Philtre

Semiconductors; Test equipment

An operation that selectively removes noise from a signal. Electronic philtres include low-pass, band-pass, and high-pass types. Mathematical philtres can operate on data to extract information and ...

Active test site

Semiconductors; Test equipment

An operational test site that has its tester channel numbers present in the test-programs pinlists. A multisite device test starts with all operational sites active. If a device fails, its site is ...

I/O channel

Semiconductors; Test equipment

An input/output tester port that is capable of both stimulating a device pin and monitoring a response from the same pin.

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