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Test equipment

Contributors in Test equipment

Test equipment

Site number

Semiconductors; Test equipment

A number that identifies a site location on the test head.

Strobe

Semiconductors; Test equipment

A signal that clocks a logic state into a latch or D flip flop. In a semiconductor test, an edge strobe records a comparison result at a specified instant in the cycle; a window strobe records any ...

Shift register sequence generator (SRSG)

Semiconductors; Test equipment

A simple PRPG (single output) defined here because it's used in the definition of STUMPS.

Multiplexer (MUX)

Semiconductors; Test equipment

A set of semiconductor or electromechanical switches arranged to select one of many inputs to a single output.

Composite video

Semiconductors; Test equipment

A signal composed of luminance (black and white),chrominance (color), blanking pulses, sync pulses, and a color-burst signal.

I/O address

Semiconductors; Test equipment

A specific hardware circuit and software value that the CPU uses to distinguish between the different boards in a system.

Surge

Semiconductors; Test equipment

A sudden change (usually an increase) in the voltage on a powerline. A surge is similar to a spike, but it lasts longer.

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