Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Soft fault

Semiconductors; Test equipment

Any fault caused by a parametric or process variation outside of tolerance or nominal values is called a soft fault.

Degradation

Semiconductors; Test equipment

An unwanted change in the performance of a system undergoing testing. A degradation is not necessarily a malfunction or failure.

Area analysis

Semiconductors; Test equipment

An image-analysis technique that finds the area in an image that falls within a range of specific grey levels.

Stimulus

Semiconductors; Test equipment

An input signal which imitates action or reaction in a circuit, such as voltage or current.

Array

Semiconductors; Test equipment

An ordered arrangement of information.

Joint test action group (JTAG)

Semiconductors; Test equipment

Originally, the name of the team, through a not uncommon twist of fate, the term has come to be associated with the output of the team. JTAG is now essentially synonymous with the IEEE 1149.1 ...

Linear feedback shift register (LFSR)

Semiconductors; Test equipment

LFSRs are shift registers with exclusive-OR gates that allow some bits in the register (usually referred to as a polynomial) to feed back into selected points within the register. LFSRs are often ...