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Test equipment
Industry: Semiconductors
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Test equipment
Field strength
Semiconductors; Test equipment
The measurement of either the electric field or the magnetic field that is made in the far field. (Expressed in units of V/m, A/m, or W/m.)
Skew
Semiconductors; Test equipment
The effect of different propagation delays between signal origins and device pins (or other points, for example, probes).
Throughput rate
Semiconductors; Test equipment
The maximum repetitive rate at which a data-conversion system can operate with a specified accuracy.
Convolution
Semiconductors; Test equipment
The integration of the product of two functions in time. Convolution in the time domain is equivalent to multiplication in the frequency domain.
Parametric test
Semiconductors; Test equipment
The measurement and verification of terminal voltage and current characteristics at a device pin.
Frame rate
Semiconductors; Test equipment
The frequency at which an image is completely updated on a display monitor.
Aliasing
Semiconductors; Test equipment
There are a number of different kinds of aliasing that can occur in BIST engines. The most commonly discussed type of aliasing occurs when two faults have a cancelling effect in the signature ...
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