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Test equipment
Industry: Semiconductors
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Test equipment
Fault
Semiconductors; Test equipment
This term is used in reference to classes, or concepts, of defect types. The most common of these is the stuck at type, or fault class. In the EDA and academic worlds, a fault is a software model of ...
Isolation voltage
Semiconductors; Test equipment
The voltage that an isolated circuit can normally withstand. Isolation voltage is specified from input to input or from any input to the amplifier output.
Parametric faults
Semiconductors; Test equipment
These faults are caused by variations in component parameter values produced by process or environmental changes.
Catastrophic fault
Semiconductors; Test equipment
These are faults such as open and short circuits that cause sudden and large variation in component values.
Compliance voltage
Semiconductors; Test equipment
The voltage range a current source or sink can produce within its constant current specifications.
Ambient level
Semiconductors; Test equipment
The values of signals and noise that exist at a test location when the device under test is not active.
Brightness
Semiconductors; Test equipment
The value associated with a pixel that represents a grey value between black and white.
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