Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Channel

Semiconductors; Test equipment

The tester functions and the path through a pin-group card and DUT fixture dedicated to one DUT pin.

Checksum

Semiconductors; Test equipment

The sum of a group of data values. Usually transmitted with the data to assist in error detection.

Interrupt handler

Semiconductors; Test equipment

The software routine that handles an interrupt's request for service.

Cycle time

Semiconductors; Test equipment

The time duration from the start of one cycle to the start of the next.

The next generation of wireless technology beyond personal communications services. The World Administrative Radio Conference assigned 230 megahertz of spectrum at 2 GHz for multimedia 3G networks. ...

Electromigration

Semiconductors; Test equipment

(1)A process in which structures on an integrated circuit's substrate are eroded by the flow of electrons in much the same way as land is eroded by a river (also known as subatomic erosion). (2)The ...

Half digit resolution

Semiconductors; Test equipment

(1/2 digit) - The 1/2 or "half" in describing the resolution of an instrument to make it 3 1/2 digit or 4 1/2 has a mysterious origin. Conventional wisdom has it that it refers to the front digit, ...