Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Interoperability

Semiconductors; Test equipment

(1) The ability of systems, units or forces to provide services to and accept services from other systems, units or forces and to use the services so exchanged to enable them to operate effectively ...

Lead

Semiconductors; Test equipment

(1)A metallic element (chemical symbol Pb). (2)A metal conductor used to provide a connexion from the inside of a device package to the outside world for soldering or other mounting techniques. Leads ...

False alarm rate

Semiconductors; Test equipment

(1) The number of false alarms per unit time or other life units (for example, sorties). (2) Number of false alarms per BIT alarms expressed as a percentage.

Synchronous

Semiconductors; Test equipment

(1)A signal whose data is not acknowledged or acted upon until the next active edge of a clock signal. (2)A system whose operation is synchronised by a clock signal.

Dielectric layer

Semiconductors; Test equipment

(1)An insulating layer used to separate two signal layers. (2)An insulating layer used to modify the electrical characteristics of an MCM-D substrate

Background debug mode interface (BDM)

Semiconductors; Test equipment

An electronic interface that allows debugging of embedded systems. Specifically, it provides in-circuit debugging functionality in microcontrollers. It requires a single wire and specialised ...

Bit error rate (BER)

Semiconductors; Test equipment

In a digital transmission, BER is the percentage of bits with errors divided by the total number of bits that have been transmitted, received or processed over a given time period. The rate is ...