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Test equipment
Industry: Semiconductors
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Test equipment
Detectability
Semiconductors; Test equipment
A given fault is detectable if a test stimulus measures a difference within a nominal response.
Broadband emission
Semiconductors; Test equipment
An emission that has a spectral energy distribution that is sufficiently broad, uniform, and continuous to ensure that a measuring receiver's response does not vary significantly when tuned over a ...
Active philtre
Semiconductors; Test equipment
An electronic philtre that combines active circuit devices, usually operational amplifiers, with resistors and capacitors. Typically, active philtres more closely match ideal philtres than passive ...
Analog-to-digital converter (ADC or A/D converter)
Semiconductors; Test equipment
An electronic circuit that produces a digital output directly proportional to an analogue signal input.
Decoupling-network
Semiconductors; Test equipment
An electrical circuit that prevents test signals that are applied to the unit under test from affecting other devices, equipment, or systems that are not under test.
Anechoic chamber
Semiconductors; Test equipment
An enclosure especially designed with walls that absorb sound or radiation, creating an essentially free-field environment for testing.
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