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Test equipment

Contributors in Test equipment

Test equipment

Detectability

Semiconductors; Test equipment

A given fault is detectable if a test stimulus measures a difference within a nominal response.

Tristate

Semiconductors; Test equipment

A high-impedance third state for a device output.

Broadband emission

Semiconductors; Test equipment

An emission that has a spectral energy distribution that is sufficiently broad, uniform, and continuous to ensure that a measuring receiver's response does not vary significantly when tuned over a ...

Active philtre

Semiconductors; Test equipment

An electronic philtre that combines active circuit devices, usually operational amplifiers, with resistors and capacitors. Typically, active philtres more closely match ideal philtres than passive ...

Analog-to-digital converter (ADC or A/D converter)

Semiconductors; Test equipment

An electronic circuit that produces a digital output directly proportional to an analogue signal input.

Decoupling-network

Semiconductors; Test equipment

An electrical circuit that prevents test signals that are applied to the unit under test from affecting other devices, equipment, or systems that are not under test.

Anechoic chamber

Semiconductors; Test equipment

An enclosure especially designed with walls that absorb sound or radiation, creating an essentially free-field environment for testing.

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