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Test equipment

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Test equipment

Decibel (dB)

Semiconductors; Test equipment

A logarithmic measure of the ratio of two signal levels: dB = 20 log (Voltage1 / Voltage2) dB = 10 log (Power1 / Power2)Variants on the decibel (dB) used in spectrum-analysis and ...

Shmoo plot

Semiconductors; Test equipment

A graph of pass/fail test results that plots pairs of test criteria such as frequency vs. voltage, or voltage vs. temperature. The shapes of such plots may resemble (roughly) the ghost-like Shmoo ...

Harmonic distortion (HD)

Semiconductors; Test equipment

A form of distortion in analogue circuits that generates harmonics (signals whose frequencies are integer multiples of the input signal). It is calculated as the ratio of a single harmonic to the ...

Pogo pin

Semiconductors; Test equipment

A kind of spring-loaded pin formed of two small tubular sections joined together with an internal spring and with a contactor formed on the end of the smaller tube; used to contact pads on a circuit ...

Cyclic redundancy cheque (CRC)

Semiconductors; Test equipment

A mathematically generated number that data receivers use to verify the proper bit arrangement in a bit stream.

Hard fault

Semiconductors; Test equipment

A hard fault is a potential open or short circuit in the design modelling the effects of manufacturing defects on the network connects.

Discrete cosine transform

Semiconductors; Test equipment

A mathematical operation that compresses video data in JPEG and MPEG files.

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